Skip to Content
Merck
  • Evolution of electronic structure in atomically thin sheets of WS2 and WSe2.

Evolution of electronic structure in atomically thin sheets of WS2 and WSe2.

ACS nano (2012-12-22)
Weijie Zhao, Zohreh Ghorannevis, Leiqiang Chu, Minglin Toh, Christian Kloc, Ping-Heng Tan, Goki Eda
ABSTRACT

Geometrical confinement effect in exfoliated sheets of layered materials leads to significant evolution of energy dispersion in mono- to few-layer thickness regime. Molybdenum disulfide (MoS(2)) was recently found to exhibit indirect-to-direct gap transition when the thickness is reduced to a single monolayer. Emerging photoluminescence (PL) from monolayer MoS(2) opens up opportunities for a range of novel optoelectronic applications of the material. Here we report differential reflectance and PL spectra of mono- to few-layer WS(2) and WSe(2) that indicate that the band structure of these materials undergoes similar indirect-to-direct gap transition when thinned to a single monolayer. The transition is evidenced by distinctly enhanced PL peak centered at 630 and 750 nm in monolayer WS(2) and WSe(2), respectively. Few-layer flakes are found to exhibit comparatively strong indirect gap emission along with direct gap hot electron emission, suggesting high quality of synthetic crystals prepared by a chemical vapor transport method. Fine absorption and emission features and their thickness dependence suggest a strong effect of Se p-orbitals on the d electron band structure as well as interlayer coupling in WSe(2).

MATERIALS
Product Number
Brand
Product Description

Sigma-Aldrich
Tungsten, powder, 12 μm, 99.9% trace metals basis
Sigma-Aldrich
Tungsten, powder (monocrystalline), 0.6-1 μm, ≥99.9% trace metals basis
Sigma-Aldrich
Tungsten, foil, thickness 0.25 mm, ≥99.9% trace metals basis
Sigma-Aldrich
Tungsten, foil, thickness 0.5 mm, ≥99.9% trace metals basis
Sigma-Aldrich
Tungsten, foil, thickness 0.127 mm, ≥99.9% trace metals basis
Sigma-Aldrich
Tungsten, wire, diam. 0.25 mm, ≥99.9% trace metals basis
Sigma-Aldrich
Tungsten, wire, diam. 1.0 mm, 99.99% trace metals basis
Sigma-Aldrich
Tungsten, powder, ≤10 μm, ≥99.99% trace metals basis
Sigma-Aldrich
Tungsten, wire, diam. 0.5 mm, ≥99.9% trace metals basis