US EPA Method 8270: GC Analysis of Semivolatiles on SLB^®-5ms, Comparison to Three Competitive Columns

column

SLB-5ms 30 m x 0.25 mm I.D., 0.25 μm (28471-U)

oven

40 °C (3 min), 20 °C/min to 100 °C, 10 °C/min to 200 °C, 30 °C/min to 325 °C (5 min)

inj. temp.

250 °C

MSD interface

325 °C

scan range

40-450 amu

carrier gas

helium, pressure programmed, 20 psi (0 min), 99 psi/min to 80 psi (0 min), 99 psi/min to 16.5 psi (3 min), 99 psi/min to 25 psi (hold remainder of run)

injection

1.0 μL splitless (0.75 min)

liner

4 mm I.D., single taper

sample

5 ng on-column of a 74 component semivolatile standard and 8 surrogate compounds, plus 6 internal standards (at 50 ng on-column)