NIST8820

Scanning Electron Microscope Scale Calibration Artifact

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• 実験式（ヒル表記法）: Si
• CAS番号: 7440-21-3
• 分子量: 28.09
• UNSPSCコード: 41116107

特性

• 形状: chips
• 包装: pkg of 1 g (20mm x 20mm chip)
• メーカー／製品名: NIST^®
• テクニック: electron microscopy: suitable
• アプリケーション: semiconductor
• 保管温度: 15-25°C
• InChI: 1S/Si
• InChI Key: XUIMIQQOPSSXEZ-UHFFFAOYSA-N

詳細

詳細

Reference Material (RM) 8820 is primarily intended to be used for X and Y scale (or magnification) calibrations from less than 10 times magnifications to more than 100 000 times magnifications in scanning electron microscopes (SEMs). It was designed to provide good contrast at low and high electron landing energies (accelerating voltages). Beyond testing scale calibration, it can be used for non-linearity measurements, especially at lower than 10,000 times magnifications. It can also be used for optical and scanning probe and other types of microscopes. Most SEMs require a set of calibration structures of different sizes to cover the full range of possible magnifications. This Reference Material (in part using the ideas implemented in earlier NIST scale calibration artifacts) is designed to meet that need. A unit of RM 8820 consists of a 20 mm × 20 mm lithographically patterned silicon chip.

SRM 8820_cert

SRM 8820 _SDS

その他情報

Please download a current certificate at nist.gov/SRM for current analytes and certified values.

法的情報

NIST is a registered trademark of National Institute of Standards and Technology

SRM is a registered trademark of National Institute of Standards and Technology