342890
Silicon dioxide
−325 mesh, 99.5% trace metals basis
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All Photos(3)
Synonym(s):
Cristobalite, Quartz, Sand, Silica
Linear Formula:
SiO2
CAS Number:
Molecular Weight:
60.08
EC Number:
MDL number:
UNSPSC Code:
12352303
PubChem Substance ID:
NACRES:
NA.23
Recommended Products
Quality Level
assay
99.5% trace metals basis
form
powder
refractive index
n20/D 1.544 (lit.)
particle size
−325 mesh
mp
1610 °C (lit.)
density
2.6 g/mL at 25 °C (lit.)
application(s)
battery manufacturing
SMILES string
O=[Si]=O
InChI
1S/O2Si/c1-3-2
InChI key
VYPSYNLAJGMNEJ-UHFFFAOYSA-N
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Application
SiO2 is majorly used as a substrate material with excellent thermo-mechanical properties which can be used in a variety of applications which include: vapor deposition, phase deposition, atomic force microscopy probes(AFM), spin coating, electronic based devices.
Other Notes
May contain adsorbed H2O and CO2 which is removable by calcining at >900°C
wgk_germany
nwg
flash_point_f
Not applicable
flash_point_c
Not applicable
ppe
dust mask type N95 (US), Eyeshields, Gloves
Certificates of Analysis (COA)
Search for Certificates of Analysis (COA) by entering the products Lot/Batch Number. Lot and Batch Numbers can be found on a product’s label following the words ‘Lot’ or ‘Batch’.
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The effect of calcination temperature on the surface microstructure and photocatalytic activity of TiO2 thin films prepared by liquid phase deposition.
Yu J, et al.
The Journal of Physical Chemistry B, 107(50), 13871-13879 (2003)
Exciton diffusion measurements in poly (3-hexylthiophene).
Shaw PE, et al.
Advanced Materials, 20(18), 3516-3520 (2008)
Oxygen-aided synthesis of polycrystalline graphene on silicon dioxide substrates.
Chen J, et al.
Journal of the American Chemical Society, 133(44), 17548-17551 (2011)
Measurement of the adhesion force between carbon nanotubes and a silicon dioxide substrate.
Whittaker JD, et al.
Nano Letters, 6(5), 953-957 (2006)
Growth model of bamboo-shaped carbon nanotubes by thermal chemical vapor deposition.
Lee CJ and Park J
Applied Physics Letters, 77(21), 3397-3399 (2000)
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