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15747

Supelco

Silicon Standard for ICP

TraceCERT®, 1 g/L Si in NaOH (nominal concentration)

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NACRES:
NA.24

grade

certified reference material
TraceCERT®

Quality Level

product line

TraceCERT®

concentration

1 g/L Si in NaOH (nominal concentration)

technique(s)

ICP: suitable

format

single component solution

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format

single component solution

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format

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format

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product line

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product line

TraceCERT®

product line

TraceCERT®

concentration

1 g/L Si in NaOH (nominal concentration)

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Quality Level

300

Quality Level

300

Quality Level

300

Quality Level

300

General description

This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.

Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.

Download your certificate at http://www.sigma-aldrich.com to view certified values, including uncertainty, date of expiry, and detailed information about trace impurities.

Application

50 ng/g of Silicon standard may be used to improve maximum signal-to-background intensity ratios (SBR) during High-resolution inductively coupled plasma mass spectrometry (HR-ICP-MS).

Analysis Note

1 g/L Si in 2% sodium hydroxide, prepared with high purity Si, NaOH and water

Other Notes

For a complete product listing of our TraceCERT® range of CRMs for ICP and AAS, technical information, and example certificates please visit our ICP & AAS standards website

Legal Information

TraceCERT is a registered trademark of Merck KGaA, Darmstadt, Germany

pictograms

Corrosion

signalword

Danger

Hazard Classifications

Eye Dam. 1 - Met. Corr. 1 - Skin Corr. 1B

Storage Class

8B - Non-combustible, corrosive hazardous materials

wgk_germany

nwg

flash_point_f

Not applicable

flash_point_c

Not applicable

ppe

Faceshields, Gloves, Goggles, type ABEK (EN14387) respirator filter


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Trace-level determination and insight in speciation of silicon in petrochemical samples by flow-injection high resolution ICP MS and HPLC-high resolution ICP MS.
Pohl, Pawel, et al.
Journal of Analytical Atomic Spectrometry, 25.9, 1461-1466 (2010)

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