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  • A 5-day method for determination of soluble silicon concentrations in nonliquid fertilizer materials using a sodium carbonate-ammonium nitrate extractant followed by visible spectroscopy with heteropoly blue analysis: single-laboratory validation.

A 5-day method for determination of soluble silicon concentrations in nonliquid fertilizer materials using a sodium carbonate-ammonium nitrate extractant followed by visible spectroscopy with heteropoly blue analysis: single-laboratory validation.

Journal of AOAC International (2013-06-19)
Dennis Sebastian, Hugh Rodrigues, Charles Kinsey, Gaspar Korndörfer, Hamilton Pereira, Guilherme Buck, Lawrence Datnoff, Stephen Miranda, Mary Provance-Bowley
ABSTRACT

A 5-day method for determining the soluble silicon (Si) concentrations in nonliquid fertilizer products was developed using a sodium carbonate (Na2CO3)-ammonium nitrate (NH4NO3) extractant followed by visible spectroscopy with heteropoly blue analysis at 660 nm. The 5-Day Na2CO3-NH4NO3 Soluble Si Extraction Method can be applied to quantify the plant-available Si in solid fertilizer products at levels ranging from 0.2 to 8.4% Si with an LOD of 0.06%, and LOQ of 0.20%. This Si extraction method for fertilizers correlates well with plant uptake of Si (r2 = 0.96 for a range of solid fertilizers) and is applicable to solid Si fertilizer products including blended products and beneficial substances. Fertilizer materials can be processed as received using commercially available laboratory chemicals and materials at ambient laboratory temperatures. The single-laboratory validation of the 5-Day Na2CO3-NH4NO3 Soluble Si Extraction Method has been approved by The Association of American Plant Food Control Officials for testing nonliquid Si fertilizer products.

MATERIALS
Product Number
Brand
Product Description

Sigma-Aldrich
Sodium carbonate, ACS reagent (primary standard), anhydrous, 99.95-100.05% dry basis
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Sodium carbonate monohydrate, ACS reagent, ≥99.5%
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Sodium carbonate, BioXtra, ≥99.0%
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Sodium carbonate, anhydrous, powder, 99.999% trace metals basis
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Sodium carbonate decahydrate, 99.999% trace metals basis
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Sodium carbonate, puriss., meets analytical specification of Ph. Eur., BP, NF, FCC, E500, anhydrous, 99.5-100.5% (calc. to the dried substance)
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Sodium carbonate monohydrate, ReagentPlus®, ≥99.5%
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Sodium carbonate, ReagentPlus®, ≥99.5%
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Sodium carbonate decahydrate, puriss. p.a., ≥99.0% (T)
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Sodium carbonate, anhydrous, free-flowing, Redi-Dri, ReagentPlus®, ≥99.5%
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Sodium carbonate, anhydrous, free-flowing, Redi-Dri, ACS reagent (primary standard), 99.95-100.05% dry basis
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Sodium carbonate monohydrate, puriss., meets analytical specification of Ph. Eur., BP, NF, FCC, E500, 99.5-100.5% (ex dried subst.)
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Sodium carbonate concentrate, 0.1 M Na2CO3 in water, eluent concentrate for IC
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Ammonium nitrate, JIS special grade, ≥99.0%
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Ammonium nitrate, SAJ first grade
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Silicon, wafer (single side polished), <100>, N-type, contains phosphorus as dopant, diam. × thickness 2 in. × 0.5 mm
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Silicon, wafer (single side polished), <111>, P-type, contains boron as dopant, diam. × thickness 3 in. × 0.5 mm
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Silicon, wafer (single side polished), <100>, P-type, contains boron as dopant, diam. × thickness 2 in. × 0.5 mm
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Silicon, wafer (single side polished), <111>, N-type, contains no dopant, diam. × thickness 3 in. × 0.5 mm
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Silicon, wafer (single side polished), <111>, N-type, contains phosphorus as dopant, diam. × thickness 2 in. × 0.5 mm
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Silicon, wafer (single side polished), <100>, N-type, contains no dopant, diam. × thickness 3 in. × 0.5 mm
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Silicon, wafer (single side polished), <111>, N-type, contains no dopant, diam. × thickness 2 in. × 0.5 mm
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Silicon, wafer (single side polished), <100>, N-type, contains phosphorus as dopant, diam. × thickness 3 in. × 0.5 mm
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Silicon, wafer (single side polished), <100>, N-type, contains no dopant, diam. × thickness 2 in. × 0.5 mm
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Silicon, wafer, <111>, P-type, contains boron as dopant, diam. × thickness 2 in. × 0.3 mm