์ฝ˜ํ…์ธ ๋กœ ๊ฑด๋„ˆ๋›ฐ๊ธฐ
Merck
๋ชจ๋“  ์‚ฌ์ง„(1)

์ฃผ์š” ๋ฌธ์„œ

667498

Sigma-Aldrich

Tungsten etchant

๋™์˜์–ด(๋“ค):

Tungsten etch

๋กœ๊ทธ์ธ์กฐ์ง ๋ฐ ๊ณ„์•ฝ ๊ฐ€๊ฒฉ ๋ณด๊ธฐ


About This Item

MDL number:
UNSPSC ์ฝ”๋“œ:
12352300
NACRES:
NA.23

Quality Level

๊ด€๋ จ ์นดํ…Œ๊ณ ๋ฆฌ

์ผ๋ฐ˜ ์„ค๋ช…

Tungsten etchant is a mixture of potassium hydroxide and potassium ferricyanide based solution that facilitates the removal of tungsten and other materials like aluminium by dipping the substrate into the etching solution.

์• ํ”Œ๋ฆฌ์ผ€์ด์…˜

Selective etchants for tungsten thin-film metallizations used in semiconductor and microelectronics technology. Etchants are buffered, mildly alkaline ferricyanide-based formulations providing high resolution patterns with minimal undercutting and photoresist compatibility. Etchant is ready to use (no dilution required). Controlled, uniform etching is achieved by immersion or spray etch technique. Etch Capacity (rate declines at โˆผ70%) of 64 g/gallon. Recommended Operating Temperatures: 20-80 ยฐC (30-40 ยฐC most common).

์ œ์กฐ ๋ฉ”๋ชจ

1. Select your etching method according to the table belowEtch Rate (Immersion) Etch Rate (Spray)
  • 20ยฐC = 30 ร…/second
  • 30ยฐC = 140 ร…/second 20ยฐC = 80 ร…/second
  • 60ยฐC = 250 ร…/second

2. Rinse with DI water

ํ”ฝํ† ๊ทธ๋žจ

Corrosion

์‹ ํ˜ธ์–ด

Danger

์œ ํ•ด ๋ฐ ์œ„ํ—˜ ์„ฑ๋ช…์„œ

์˜ˆ๋ฐฉ์กฐ์น˜ ์„ฑ๋ช…์„œ

Hazard Classifications

Aquatic Chronic 3 - Eye Dam. 1 - Met. Corr. 1 - Skin Corr. 1A

๋ณด์ถฉ์ œ ์œ„ํ—˜์„ฑ

Storage Class Code

8B - Non-combustible corrosive hazardous materials

WGK

WGK 2

Flash Point (ยฐF)

Not applicable

Flash Point (ยฐC)

Not applicable

๊ฐœ์ธ ๋ณดํ˜ธ ์žฅ๋น„

Faceshields, Gloves, Goggles, type ABEK (EN14387) respirator filter


๊ฐ€์žฅ ์ตœ์‹  ๋ฒ„์ „ ์ค‘ ํ•˜๋‚˜๋ฅผ ์„ ํƒํ•˜์„ธ์š”:

์‹œํ—˜ ์„ฑ์ ์„œ(COA)

Lot/Batch Number

์ ํ•ฉํ•œ ๋ฒ„์ „์„ ์ฐพ์„ ์ˆ˜ ์—†์œผ์‹ ๊ฐ€์š”?

ํŠน์ • ๋ฒ„์ „์ด ํ•„์š”ํ•œ ๊ฒฝ์šฐ ๋กœํŠธ ๋ฒˆํ˜ธ๋‚˜ ๋ฐฐ์น˜ ๋ฒˆํ˜ธ๋กœ ํŠน์ • ์ธ์ฆ์„œ๋ฅผ ์ฐพ์„ ์ˆ˜ ์žˆ์Šต๋‹ˆ๋‹ค.

์ด ์ œํ’ˆ์„ ์ด๋ฏธ ๊ฐ€์ง€๊ณ  ๊ณ„์‹ญ๋‹ˆ๊นŒ?

๋ฌธ์„œ ๋ผ์ด๋ธŒ๋Ÿฌ๋ฆฌ์—์„œ ์ตœ๊ทผ์— ๊ตฌ๋งคํ•œ ์ œํ’ˆ์— ๋Œ€ํ•œ ๋ฌธ์„œ๋ฅผ ์ฐพ์•„๋ณด์„ธ์š”.

๋ฌธ์„œ ๋ผ์ด๋ธŒ๋Ÿฌ๋ฆฌ ๋ฐฉ๋ฌธ

Pattern processing results and characteristics for SCALPEL masks.
Novembre AE, et al.
Microelectronic Engineering, 46(1-4), 271-274 (1999)
Electrostatically actuated copper-blade microrelays.
Lee H, et al.
Sensors and actuators A, Physical, 100(1), 105-113 (2002)
Microstructure Evolution of W-Cu Alloy Wire.
Shao F, et al.
Materials Sciences and Applications, 3(03), 157-157 (2012)

์ž์‚ฌ์˜ ๊ณผํ•™์žํŒ€์€ ์ƒ๋ช… ๊ณผํ•™, ์žฌ๋ฃŒ ๊ณผํ•™, ํ™”ํ•™ ํ•ฉ์„ฑ, ํฌ๋กœ๋งˆํ† ๊ทธ๋ž˜ํ”ผ, ๋ถ„์„ ๋ฐ ๊ธฐํƒ€ ๋งŽ์€ ์˜์—ญ์„ ํฌํ•จํ•œ ๋ชจ๋“  ๊ณผํ•™ ๋ถ„์•ผ์— ๊ฒฝํ—˜์ด ์žˆ์Šต๋‹ˆ๋‹ค..

๊ณ ๊ฐ์ง€์›ํŒ€์œผ๋กœ ์—ฐ๋ฝ๋ฐ”๋ž๋‹ˆ๋‹ค.